@conference{Glaros1986_1,
author = "Glaros, Nicholas and Kayafas, Eleftherios",
abstract = "A digital IC tester was designed and implemented to serve the needs of an electronics laboratory. The tester (i) checks the operational condition of a series of integrated circuits that mostly realise sequential and combinational functions, (ii) provides user with a feedback on the various malfunctioning conditions that may occur in parts of the IC being tested or in the entire body of it.",
address = "Rhodes, Greece",
booktitle = "Proceedings of First European Workshop for System Fault Diagnostics, Reliability and Related Knowledge-Based Approaches",
editor = "G.S. Tzafestas; G. Madan Singh; G{\"u}nther Schmidt",
keywords = "digital IC testing, microprocessor-based systems",
month = "Aug. 31-Sept. 3 ",
pages = "417-422",
publisher = "D. Reitel Publishing Company",
title = "{E}xperimental {D}evice for {I}C {T}esting ",
volume = "2",
year = "1987",
}