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Experimental Device for IC Testing
Research Area:
Other topics in Computer Science
Type:
In Proceedings
| Year: | 1987 | ||||
|---|---|---|---|---|---|
| Authors: | Nicholas Glaros; Eleftherios Kayafas | ||||
| Editor: | G.S. Tzafestas; G. Madan Singh; Günther Schmidt | ||||
| Volume: | 2 | ||||
| Book title: | Proceedings of First European Workshop for System Fault Diagnostics, Reliability and Related Knowledge-Based Approaches | ||||
| Pages: | 417-422 | ||||
| Address: | Rhodes, Greece | ||||
| Date: | Aug. 31-Sept. 3 | ||||
| Abstract: | A digital IC tester was designed and implemented to serve the needs of an electronics laboratory. The tester (i) checks the operational condition of a series of integrated circuits that mostly realise sequential and combinational functions, (ii) provides user with a feedback on the various malfunctioning conditions that may occur in parts of the IC being tested or in the entire body of it. |
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