ΕΡΓΑ
Experimental Device for IC Testing
Ερευνητική περιοχή:  
Άλλα θέματα Πληροφορικής
Είδος:  
Άρθρο σε πρακτικά
| Έτος: | 1987 | ||||
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| Συγγραφείς: | Νίκος Γλάρος; Eleftherios Kayafas | ||||
| Επιμέλεια: | G.S. Tzafestas; G. Madan Singh; Günther Schmidt | ||||
| Τόμος: | 2 | ||||
| Τίτλος βιβλίου: | Proceedings of First European Workshop for System Fault Diagnostics, Reliability and Related Knowledge-Based Approaches | ||||
| Σελίδες: | 417-422 | ||||
| Διεύθυνση: | Rhodes, Greece | ||||
| Ημερομηνία: | Aug. 31-Sept. 3 | ||||
| Περίληψη: | A digital IC tester was designed and implemented to serve the needs of an electronics laboratory. The tester (i) checks the operational condition of a series of integrated circuits that mostly realise sequential and combinational functions, (ii) provides user with a feedback on the various malfunctioning conditions that may occur in parts of the IC being tested or in the entire body of it. |
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