Δημοσίευση - Experimental Device for IC Testing
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Experimental Device for IC Testing

Ερευνητική περιοχή:  
Άλλα θέματα Πληροφορικής
    
Είδος:  
Άρθρο σε πρακτικά

 

Έτος: 1987
Συγγραφείς: Νίκος Γλάρος; Eleftherios Kayafas
Επιμέλεια: G.S. Tzafestas; G. Madan Singh; Günther Schmidt
Τόμος: 2
Τίτλος βιβλίου: Proceedings of First European Workshop for System Fault Diagnostics, Reliability and Related Knowledge-Based Approaches
Σελίδες: 417-422
Διεύθυνση: Rhodes, Greece
Ημερομηνία: Aug. 31-Sept. 3
Περίληψη:
A digital IC tester was designed and implemented to serve the needs of an electronics laboratory. The tester (i) checks the operational condition of a series of integrated circuits that mostly realise sequential and combinational functions, (ii) provides user with a feedback on the various malfunctioning conditions that may occur in parts of the IC being tested or in the entire body of it.
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